On Delay Fault Testing In Logic Circuits

·1987·DOI

Engineering and Technology

Communication and Signal Processing

Software and Electronic Testing

VLSI Test Generation Methods

Role in the Field

Neutralin Engineering and Technology

Neutralin Communication and Signal Processing

Neutralin Software and Electronic Testing

Neutralin VLSI Test Generation Methods

Abstract

Citations

296

Year

1987

PageRank

3.5 / 10

Relative influence (log-scaled)

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