Built-in Test For Circuits With Scan Based On Reseeding Of Multiple-Polynomial Linear Feedback Shift Registers

·1995·DOI
Engineering and Technology
Communication and Signal Processing
Software and Electronic Testing
VLSI Test Generation Methods

Role in the Field

Neutralin Engineering and Technology
Neutralin Communication and Signal Processing
Neutralin Software and Electronic Testing
Neutralin VLSI Test Generation Methods

Abstract

Citations

323

Year

1995

PageRank

3.4 / 10

Relative influence (log-scaled)

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