Thin Dielectric Layers in Electronics
Focusing on the role of thin dielectric layers in metal-oxide-semiconductor (MOS) devices, this cluster examines the effects of radiation and other external influences on device performance. It emphasizes simulations and defect analysis within these materials.
610 papers
Parent topic: Dielectric and Material Properties
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Papers Over Time
Top Papers
1977 · 131 citations
1987 · 72 citations
1981 · 71 citations
1996 · 61 citations
1985 · 57 citations
1997 · 45 citations
2007 · 36 citations
2018 · 36 citations
1970 · 32 citations
1940 · 28 citations
1992 · 23 citations
1969 · 21 citations
2015 · 21 citations
2001 · 18 citations
1955 · 18 citations
1990 · 16 citations
0 · 15 citations
2008 · 13 citations