IC Testing Optimization Methods

This cluster centers on optimization techniques and design strategies for integrated circuit testing. It includes approaches for clock skew optimization and variation-aware design kits.

IC testing
optimization
design techniques
clock skew
variation-aware design

3,185 papers

Parent topic: Software and Electronic Testing

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Papers Over Time

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Top Papers

Clock Skew Optimization

1990 · 388 citations

FreePDK: An Open-Source Variation-Aware Design Kit

2007 · 313 citations

Too Much Delay Fault Coverage Is A Bad Thing

0 · 207 citations

X-compact: An Efficient Response Compaction Technique For Test Cost Reduction

0 · 168 citations

A Structured Test Re-Use Methodology For Core-Based System Chips

0 · 151 citations

The Ballast Methodology For Structured Partial Scan Design

1990 · 143 citations

Drop Impact Reliability Testing For Lead-Free And Lead-Based Soldered IC Packages

2006 · 137 citations

Solving The Third-Shift Problem In IC Piracy With Test-Aware Logic Locking

2015 · 136 citations

DYNAMITE: An Efficient Automatic Test Pattern Generation System For Path Delay Faults

1991 · 130 citations

Scan Chain Design For Test Time Reduction In Core-Based ICs

0 · 128 citations

ATPG For Heat Dissipation Minimization During Test Application

1998 · 117 citations

Scalable Test Generation For Trojan Detection Using Side Channel Analysis

2018 · 106 citations

Reducing Power Dissipation During Test Using Scan Chain Disable

0 · 104 citations

False-path-aware Statistical Timing Analysis And Efficient Path Selection For Delay Testing And Timing Validation

2002 · 88 citations

Test Wrapper And Test Access Mechanism Co-Optimization For System-On-Chip

0 · 85 citations

Pattern Generation For Delay Testing And Dynamic Timing Analysis Considering Power-Supply Noise Effects

2001 · 78 citations

LT-RTPG: A New Test-Per-Scan BIST TPG For Low Heat Dissipation

0 · 69 citations

Consistency-based Characterization For IC Trojan Detection

2009 · 67 citations

Predictive Subset Testing: Optimizing IC Parametric Performance Testing For Quality, Cost, And Yield

1989 · 66 citations

Testing Embedded Cores Using Partial Isolation Rings

0 · 65 citations