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  3. Line-pattern Collapse Mitigation Status For EUV At 32Nm HP And Below

Line-pattern Collapse Mitigation Status For EUV At 32Nm HP And Below

·2012·DOI
Engineering and Technology
Optical Science and Technology
CMOS and High-Frequency Circuit Design
Networks-on-Chip Technology

Role in the Field

Neutralin Engineering and Technology
Neutralin Optical Science and Technology
Neutralin CMOS and High-Frequency Circuit Design
Neutralin Networks-on-Chip Technology

Abstract

Citations

2

Year

2012

PageRank

0.1 / 10

Relative influence (log-scaled)

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