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  3. Determination Of The Thickness And Optical Constants Of Amorphous Silicon

Determination Of The Thickness And Optical Constants Of Amorphous Silicon

·1983·DOI
Engineering and Technology
Optical Science and Technology
Dielectric and Material Properties
Thin-Film Technology and Applications

Role in the Field

Neutralin Engineering and Technology
Neutralin Optical Science and Technology
Neutralin Dielectric and Material Properties
Neutralin Thin-Film Technology and Applications

Abstract

Citations

3,423

Year

1983

PageRank

4.8 / 10

Relative influence (log-scaled)

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