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  3. Comparison Of Combinational And Sequential Error Rates For A Deep Submicron Process

Comparison Of Combinational And Sequential Error Rates For A Deep Submicron Process

·2011·DOI
Engineering and Technology
Communication and Signal Processing
VLSI Design and Technologies
Architectural Techniques in VLSI

Role in the Field

Neutralin Engineering and Technology
Neutralin Communication and Signal Processing
Neutralin VLSI Design and Technologies
Neutralin Architectural Techniques in VLSI

Abstract

Citations

117

Year

2011

PageRank

1.8 / 10

Relative influence (log-scaled)

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