Manumap
  • Explore
  • Search
  1. Home
  2. Search
  3. Calculation Of Critical Layer Thickness Versus Lattice Mismatch For GexSi1−x/Si Strained‐Layer Heterostructures

Calculation Of Critical Layer Thickness Versus Lattice Mismatch For GexSi1−x/Si Strained‐Layer Heterostructures

·1985·DOI
Engineering and Technology
Optical Science and Technology
Advanced Semiconductor Devices
Silicon-Based Nanostructures

Role in the Field

Neutralin Engineering and Technology
Neutralin Optical Science and Technology
Neutralin Advanced Semiconductor Devices
Neutralin Silicon-Based Nanostructures

Abstract

Citations

1,609

Year

1985

PageRank

4.7 / 10

Relative influence (log-scaled)

Manumap

Explore the academic research landscape through interactive visualization and discovery tools.

Navigate

  • Explore Map
  • Search Papers
© 2026 Manumap. All rights reserved.