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  3. Atomic Force Microscope–Force Mapping And Profiling On A Sub 100‐Å Scale

Atomic Force Microscope–Force Mapping And Profiling On A Sub 100‐Å Scale

·1987·DOI
Engineering and Technology
Materials Science and Physics
Advanced Materials Research
Nanoscale Force Measurement Techniques

Role in the Field

Neutralin Engineering and Technology
Neutralin Materials Science and Physics
Neutralin Advanced Materials Research
Neutralin Nanoscale Force Measurement Techniques

Abstract

Citations

1,217

Year

1987

PageRank

5.2 / 10

Relative influence (log-scaled)

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